[1] Lin S, Gong Z X. General physics experiments
[M].Beijing: Peoples education press,1981, 369-372.

[2] Azzm R A,Basham N M,Ellipsometry and polarized light Amsterdam
[M].Nolland.1977. 269～416.

[3] Chen I Y,Lynch D W,Scaming Ellipsonmetry by Rotating polarizer and Analyzer
[J],Appl Opt.1987,26,5221～5228 

[4] Chen W P ,Chen J M.Use of surface plasma waves for determination of the thickness and optical constants of thin metallic fikms
[J].Journal of the Optical Society of America,1981,71:186～191.
[5] Ott A .Exaction of nonradiative surface plasma waves in sliver by the method of frustrated total reflection
[J],Zeitschrift fur physic,1996,216:398～410 

[6] LI H G ,Cao Z Q ,Lu h f et al .Free-space coupling of a light beam into a symmetrica metal-cladding optical waveguide
[J] .Applied Physics Letters,2003,83:2757 ～2759. 

[7] Lu H F, Cao Z Q,Li H G et al.Study of ultrahigh-order modes in a symmetrical metal-clad-ding opitical waveguide
[J].Applied Physics Letters, 2004, 85: 4579～4581 

[8] Ulrich R ,Torge R. Measurement of thin film parameters with a prism copeler
[J], Applied Optics, 1973, 12: 2901～2908 

[9] Yariv A .Quantum Electronics
[M],2nd ed. New york: Wiley & SONS.1975 

[10]Lopez-Rios T,Vuye G.In situ investigation of metallic surface by surface Plasmon ATR spectroscopy,electrical eesistance mensurements and Auger spectroscopy
[J]. Journal of physics E:Scientific instruments ,1982,15:456～461 

[11]Lu Danyong, Liu Changjing, Zhou Huijun, Zhou Jin, Using Mach-Zehnder interferometer to quantitatively measure the refractive index of air and ints theoretical discussion
[J]. 2006.26(12) 

[12]Li Jingzhen,Handbook of Optics
[M], Xi’an: Shan xi science and technology press.1986.