Propagation characteristic of the metal -dielectric - metal surface plasmon polariton waveguide for high-order modes

Abstract

Abstract: A numerical analysis of surface plasmon waveguides exhibiting both propagation and distribution of electromagnetic field in Ag/SiO2/Ag (MDM) waveguides is presented. Attention is given to characterizing the dispersion relations, wavelength-dependent propagation, and energy density decay in two-dimensional metal - dielectric - metal structures. The results show that the waveguide can excitation the first order SPP mode (fundamental mode) for the wavelength of 633nm, if the dielectric film thickness is less than 85nm. With the dielectric film thickness is increased, progressively high order SPP modes are excited. The real part of the effective refractive index decreases with increasing the order of the SPP modes, but that of the imaginary part shows an opposite trend. However, when the dielectric layer of the MDM waveguide thickness is more than 0.555μm, since the third-order mode of the electromagnetic field SPP concentrated in relatively distant from the metal layer, the effective refractive index has a minimum value of the imaginary part. So the shird order SPP mode has a maximum propagation distance . When the wavelength of the incident light is 633nm, the dielectric layer thickness is 0.9μm Ag/SiO2/Ag, the transmission distance of the third-order SPP mode is about 150μm in the waveguide.

Key words: waveguide optics, Metal –dielectric - metal, Surface plasmon polariton, Propagation distances, High-order modes

CLC Number:

O431

ZHAO Hua-jun, YUAN Dai-rong. Propagation characteristic of the metal -dielectric - metal surface plasmon polariton waveguide for high-order modes[J]. J4, 2014, 31(2): 252-256.

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