采用XRF方法准确测定Yb:YAG晶体组分

量子电子学报 ›› 2021, Vol. 38 ›› Issue (2): 167-171.

• “先进光学晶体”专辑 • 上一篇下一篇

采用XRF方法准确测定Yb:YAG晶体组分

窦仁勤1, 罗建乔1, 刘文鹏1, 高进云1, 王小飞1, 何異1,2, 陈迎迎1,2, 张庆礼1

1 中国科学院合肥物质科学研究院安徽光学精密机械研究所, 安徽省光子器件与材料重点实验室, 安徽合肥230031; 2 中国科学技术大学, 安徽合肥230026

收稿日期:2020-11-03 修回日期:2020-11-24 出版日期:2021-03-28 发布日期:2021-03-29
通讯作者: E-mail: zql@aiofm.ac.cn E-mail:drq0564@aiofm.ac.cn
作者简介:窦仁勤( 1987 - ), 女, 安徽人, 博士, 主要从事晶体生长与性能表征方面的研究。E-mail: drq0564@aiofm.ac.cn
基金资助:
Supported by National Natural Science Foundation of China (国家自然科学基金, 51802307), National Key Research and Development Program of China (国家重点研发计划, 2016YFB0402101)

Accurate determination of Yb:YAG crystal components by XRF method

DOU Renqin1, LUO Jianqiao1, LIU Wenpeng1, GAO Jinyun1, WANG Xiaofei1, HE Yi1,2, CHEN Yingying1,2, ZHANG Qingli1

1 Key Laboratory of Photonic Devices and Materials, Anhui Institute of Optics and Fine Mechanics, HFIPS, Chinese Academy of Sciences, Hefei 230031, China; 2 University of Science and Technology of China, Hefei 230026, China

Received:2020-11-03 Revised:2020-11-24 Published:2021-03-28 Online:2021-03-29
Contact: Ren qinDou E-mail:drq0564@aiofm.ac.cn

摘要/Abstract

摘要： 针对目前普遍存在的难以准确测定晶体组分的问题, 提出一种以YAG 晶体为标样、采用X 射线荧光光谱分析法准确测定晶体组分的方法。测试样品分别为纯YAG 晶体、生长原料掺杂浓度1.2 at% 和2.0 at% Yb:YAG 晶体, 采用X 射线荧光光谱分析法, 对不同浓度的Yb:YAG 晶体的组分进行了无损、快速、准确的测定。以纯YAG 晶体作为标准样品, 标定主成分的含量, 大幅提高了检测结果的准确度, 主成分Y3+ 和Al3+ 的测试误差小于1%、掺杂 Yb3+ 的测试误差小于5%。通过晶体放肩初始部位Yb3+ 的浓度测定结果, 计算出Yb3+ 在两种待测晶体中的分凝系数分别为1.025 和1.045, 接近于1, 有利于实现Yb:YAG 晶体的高浓度掺杂以及优质晶体生长。2.0 at% Yb:YAG 晶体的首尾掺杂浓度差小于5%, 说明晶体等径部分掺杂浓度均匀性高。

关键词: 材料, 提拉法, Yb:YAG 晶体, X 射线荧光光谱法, 分凝系数

Abstract: In order to solve the problem that it is difficult to accurately determine the crystal composition, a method for the accurate determination of crystal composition by X-ray fluorescence spectrometry with YAG crystal as the standard sample is developed. The samples are pure YAG crystal, and the doping concentration of raw materials with 1.2 at% and 2.0 at% Yb:YAG crystals. The composition of Yb: YAG crystals with different concentration is determined by X-ray fluorescence spectrometry. Using pure YAG crystal as the standard sample, the accuracy of the detection results is greatly improved. The detection error of main components Y3+ and Al3+ is less than 1%, and that of Yb3+ is less than 5%. The results show that the segregation coefficient of Yb3+ in the crystal are 1.025 and 1.045, which are close to 1. It is conducive to the realization of high concentration doping and high quality crystal growth of Yb:YAG crystal. The doping concentration difference of 2.0 at% Yb:YAG crystal is less than 5%, which indicates that the doping concentration uniformity of equal diameter part is high.

Key words: material, Czochralski method, Yb:YAG crystal, X-ray fluorescence spectrometry, segregation coefficient

中图分类号:

O723

窦仁勤, 罗建乔, 刘文鹏, 高进云, 王小飞, 何異, 陈迎迎, 张庆礼. 采用XRF方法准确测定Yb:YAG晶体组分[J]. 量子电子学报, 2021, 38(2): 167-171.

DOU Renqin, LUO Jianqiao, LIU Wenpeng, GAO Jinyun, WANG Xiaofei, HE Yi, CHEN Yingying, ZHANG Qingli. Accurate determination of Yb:YAG crystal components by XRF method[J]. Chinese Journal of Quantum Electronics, 2021, 38(2): 167-171.

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采用XRF方法准确测定Yb:YAG晶体组分

Accurate determination of Yb:YAG crystal components by XRF method

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