X光强度关联衍射成像技术研究进展

doi:10.3969/j.issn.1007-5461.2022.06.003

摘要/Abstract

摘要： 强度关联衍射成像是一种新的衍射成像方法，该方法基于光场高阶关联特性，通过计算参考臂与探测臂光强涨落的强度关联，能够非定域地获取目标物体的傅里叶衍射谱信息。作为一种新的成像方法, 强度关联衍射成像具有非定域、弱光成像、成像分辨率高等优势，能够解决一些常规成像难以解决的问题，近年来受到了广泛的关注，未来有望在生物医学、材料科学等众多领域实现应用。本文简述了强度关联衍射成像的最新进展，同时介绍了一些图像重构的新算法，最后指出该方法目前仍然存在的问题并对其未来发展进行了展望。

关键词: 量子光学, 成像系统, 关联成像, 衍射成像, 图像重构

Abstract: Diffraction imaging via intensity correlation is a novel diffraction imaging method based on the high-order correlation characteristics of optical field. The Fourier information of a sample can be obtained nonlocally by calculating the correlation between the intensity fluctuation of the reference beam and the test beam. As a new imaging method, diffraction imaging via intensity correlation has the advantages of nonlocal imaging, low radiation and high resolution and so on, thus it can solve problems that are difficult to handle by conventional imaging. This technology has attracted much attention recently, and has great potential in biomedicine, material science and many other fields in the future. In this paper, the latest progress of diffraction imaging via intensity correlation is briefly reviewed, and some related image reconstruction algorithms are introduced. Finally, the existing problems of this method are pointed out and its future development is prospected.

Key words: quantum optics, imaging systems, ghost imaging, diffraction imaging, image reconstruction

中图分类号:

O431.2

谈志杰杨海瑞喻虹韩申生. X光强度关联衍射成像技术研究进展[J]. 量子电子学报, 2022, 39(6): 851-862.

TAN Zhijie , YANG Hairui , , YU Hong , , HAN Shensheng , ∗. Progress on X-ray diffraction imaging via intensity correlation[J]. Chinese Journal of Quantum Electronics, 2022, 39(6): 851-862.

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