J4 ›› 2017, Vol. 34 ›› Issue (3): 374-378.

• Basic Optics • Previous Articles     Next Articles

Polymer planar waveguide parameter measuring instrument based on back focal plane imaging

  

  1. Key Laboratory of Optoelectronic Science and Technology of Anhui Province,Department of Optics and Optical Engineering, University of Science and Technology of China, Hefei 230026, China
  • Received:2016-02-25 Revised:2016-04-08 Published:2017-05-28 Online:2017-05-22

Abstract: Based on the basic principle that back focal plane imaging can determine the transmission properties, a polymer planar waveguide optical parameter measuring instrument is designed combining with Fresnel reflection theory of planar waveguides. The real time measurement of the local refractive index and thickness of the sample with high accuracy and high spatial resolution is realized by fitting data with MATLAB. The measurement accuracy of planar waveguide thickness can reach nanometer scale, and the spatial resolution can reach 300 nm. The instrument is simple in structure and easy to operate. It has high application value in optical sensing and intracellular biological sensing fields.

Key words: waveguide optics; back focal plane imaging; optical parameter measuring instrument