Chinese Journal of Quantum Electronics

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Limit Resolution of Digital Mask Projection Lithography

LIU Yuhuan1, 3, ZHAO Yuanyuan2, DONG Xianzi1, ZHENG Meiling1, DUAN Xuanming1,2, ZHAO Zhensheng1   

  1. 1 Laboratory of Organic NanoPhotonics and CAS Key Laboratory of Bio-Inspired Materials and Interfacial Science, Technical Institute of Physics and Chemistry, Chinese Academy of Sciences, Beijing 100190, China; 2.Chongqing Institute of Green and Intelligent Technology, Chinese Academy of Sciences, Chongqing 401122, China; 3. School of Future Technologies ,Graduate University of Chinese Academy of Sciences, Beijing 100049, China
  • Published:2019-05-28 Online:2019-05-14

Abstract: A digital-mask projection lithography (DMPL) technology based on DMD is proposed. The femtosecond laser is used as a light source, combining with a high zoom ratio objective lens to shrink the reaction region of photoresist with photons by adjusting the light field distribution. The spatial resolution of the DMD projection lithography has been improved to submicron, and maskless projection lithography with a cross-scale processing capability (a single exposure area of over 100 μm and an exposure accuracy of hundreds nanometers) is realized. Detailed analysis of the geometry and physical optics models has been studied theoretically. We have clarified the relationship between the number of pixels and the size of the processing structure. The key technical issues of limited resolution in DMPL have been investigated based on the physical optics model.

Key words: digital-mask projective lithography, digital micromirror device, cross-scale, femtosecond laser, resolution