Chinese Journal of Quantum Electronics ›› 2021, Vol. 38 ›› Issue (2): 167-171.

• Special Issue on Advanced Optical Crystal • Previous Articles     Next Articles

Accurate determination of Yb:YAG crystal components by XRF method

DOU Renqin1, LUO Jianqiao1, LIU Wenpeng1, GAO Jinyun1, WANG Xiaofei1, HE Yi1,2, CHEN Yingying1,2, ZHANG Qingli1   

  1. 1 Key Laboratory of Photonic Devices and Materials, Anhui Institute of Optics and Fine Mechanics, HFIPS, Chinese Academy of Sciences, Hefei 230031, China; 2 University of Science and Technology of China, Hefei 230026, China
  • Received:2020-11-03 Revised:2020-11-24 Published:2021-03-28 Online:2021-03-29
  • Contact: Ren qinDou E-mail:drq0564@aiofm.ac.cn

Abstract: In order to solve the problem that it is difficult to accurately determine the crystal composition, a method for the accurate determination of crystal composition by X-ray fluorescence spectrometry with YAG crystal as the standard sample is developed. The samples are pure YAG crystal, and the doping concentration of raw materials with 1.2 at% and 2.0 at% Yb:YAG crystals. The composition of Yb: YAG crystals with different concentration is determined by X-ray fluorescence spectrometry. Using pure YAG crystal as the standard sample, the accuracy of the detection results is greatly improved. The detection error of main components Y3+ and Al3+ is less than 1%, and that of Yb3+ is less than 5%. The results show that the segregation coefficient of Yb3+ in the crystal are 1.025 and 1.045, which are close to 1. It is conducive to the realization of high concentration doping and high quality crystal growth of Yb:YAG crystal. The doping concentration difference of 2.0 at% Yb:YAG crystal is less than 5%, which indicates that the doping concentration uniformity of equal diameter part is high.

Key words: material, Czochralski method, Yb:YAG crystal, X-ray fluorescence spectrometry, segregation coefficient

CLC Number: