J4 ›› 2014, Vol. 31 ›› Issue (4): 489-501.

• 《量子电子学报》创刊三十周年纪念专辑 • 上一篇    下一篇

4H-SiC基紫外光电探测器的研究进展

蔡加法,吴正云   

  1. 厦门大学物理系,福建 厦门,361005
  • 出版日期:2014-07-28 发布日期:2014-07-30
  • 通讯作者: 吴正云(1957-)教授,博导,从事宽禁带半导体光电器件的研究。 E-mail:zhywu@xmu.edu.cn
  • 作者简介:蔡加法(1973-)福建人,博士生,从事半导体材料和器件光电性能研究。
  • 基金资助:
    国家自然科学基金(61176049)

Research Progress in 4H-SiC-based Ultraviolet Photodetectors

CAI Jia-fa, WU Zheng-yun   

  1. Department of Physics, Xiamen University, Xiamen 361005, China
  • Published:2014-07-28 Online:2014-07-30

摘要: 介绍了4H-SiC材料用于高温、低电平紫外光电检测的优点,回顾总结了近年来4H-SiC基紫外光电探测器的研究进展,分析了改善4H-SiC基紫外光电探测器性能参数如降低暗电流、提高光电响应度等可采用的各种技术手段,探讨了4H-SiC基紫外光电探测器的发展趋势。

关键词: 光电子学;4H-SiC;紫外光电探测器

Abstract: Advances in 4H silicon carbide (4H-SiC) as a potential material for low-level ultraviolet (UV) radiation detection application at high-temperature, radiation hardened conditions are introduced. The latest progress in development of and the current state-of-art of different types of 4H-SiC-based UV photodetectors were reviewed. The approaches to improve the performances of the 4H-SiC-based photodetectors such as reducing the dark current and enhancing the photo responsivity were presented. The outlook for the development of 4H-SiC-based UV photodetectors are discussed.

Key words: optoelectronics; 4H-SiC; UV photodetector

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