基于量子纠缠光源的椭圆偏振测量技术研究进展 (特邀)

doi:10.3969/j.issn.1007-5461.2025.04.002

量子电子学报 ›› 2025, Vol. 42 ›› Issue (4): 450-463.doi: 10.3969/j.issn.1007-5461.2025.04.002

• “量子精密测量与应用” 专辑 • 上一篇下一篇

基于量子纠缠光源的椭圆偏振测量技术研究进展 (特邀)

牛素俭 1,2,3, 解孟雨 1,2, 周志远 1,2*, 史保森 1,2*

1 中国科学技术大学中国科学院量子信息重点实验室, 安徽合肥 230026; 2 中国科学技术大学中国科学院量子信息与量子科技创新研究院, 安徽合肥 230026; 3 新疆师范大学物理与电子工程学院新疆发光矿物与光功能材料研究重点实验室, 新疆乌鲁木齐 830054

收稿日期:2024-12-27 修回日期:2025-02-20 出版日期:2025-07-28 发布日期:2025-07-28
通讯作者: zyzhouphy@ustc.edu.cn; drshi@ustc.edu.cn E-mail:zyzhouphy@ustc.edu.cn; drshi@ustc.edu.cn
作者简介:牛素俭 ( 1995 - ), 河南周口人, 博士, 讲师, 主要从事量子非线性光学方面的研究。 E-mail: nsj@xjnu.edu.cn
基金资助:
国家自然科学基金项目 (62435018), 科技部重点研发计划项目 (2022YFB3903102, 2022YFB3607700), 科技部科技创新2030-量子通信与量子计算机 (2021ZD0301100), 中国科学技术大学统筹推进世界一流大学和一流学科建设专项资金 (YD2030002023), 中国航天科技集团公司第八研究院产学研合作基金 (SAST2022-075), 国家资助博士后研究计划项目 (GZC20232559)

Progress on ellipsometry utilizing quantum entangled light sources

NIU Sujian 1,2,3 , XIE Mengyu 1,2 , ZHOU Zhiyuan 1,2*, SHI Baosen 1,2*

1 CAS Key Laboratory of Quantum Information, University of Science and Technology of China, Hefei 230026, China; 2 CAS Center for Excellence in Quantum Information and Quantum Physics, University of Science and Technology of China, Hefei 230026, China; 3 Xinjiang Key Laboratory of Luminescence Minerals and Optical Functional Materials, Shool of Physics and Electronic Engineering, Xinjiang Normal University, Urumqi 830054, China

Received:2024-12-27 Revised:2025-02-20 Published:2025-07-28 Online:2025-07-28

摘要/Abstract

摘要： 椭圆偏振测量仪 (以下简称偏振仪) 是用于测量样品光学性质的重要工具, 在物理、化学、材料科学等诸多领域都有着广泛的应用, 其通过精确测量偏振光在经过样品前后偏振态的变化, 并结合特定的理论模型, 达到准确评估样品多种光学性质的目的。当前, 将新型光源应用到椭圆偏振测量技术中, 以提升偏振仪的性能并拓展其应用范围, 是相关研究领域的热点之一。而量子纠缠光源因其具有突破散粒噪声理论极限的潜能、极低光强下的抗噪能力以及非局域操控等特性, 在量子精密测量领域得到广泛关注。近年来, 人们日趋关注基于量子光源与椭圆偏振测量技术相结合的量子偏振仪的原理和应用研究。本文首先回顾了经典偏振仪的工作原理和类型, 在此基础上, 重点介绍了量子偏振仪的基本原理和研究进展, 并展望了量子偏振仪的未来发展方向。

关键词: 量子信息, 量子纠缠光源, 经典偏振仪, 量子偏振仪, 量子精密测量

Abstract: Ellipsometers are essential tools used to measure the optical properties of samples, such as thin film thickness, optical constants of samples and structural profiles, by measuring the change in polarization state of polarized light before and after passing through the samples, which have wide applications in various fields, including physics, chemistry, materials science, and so on. Currently, the integration of new light sources with ellipsometry to enhance the performance of ellipsometers and expand their application scope is one of the hotspots in related research fields. Due to their unique nonclassical properties and high signal-to-noise ratio, quantum entangled light sources have attracted extensive attention in the field of quantum precision measurement. In recent years, research on the principles and applications of quantum ellipsometer, which combines quantum light sources and ellipsometry, has been increasing. The fundamentals and types of classical ellipsometers are reviewed firstly in this paper. Then, based on this, the basic principles and research progress of quantum ellipsometers are mainly introduced, followed with the prospects of their future development direction.

Key words: quantum information, quantum entangled light sources, classical polarimeter, quantum polarimeter, quantum precision measurement

中图分类号:

O431.2

牛素俭解孟雨周志远史保森. 基于量子纠缠光源的椭圆偏振测量技术研究进展 (特邀)[J]. 量子电子学报, 2025, 42(4): 450-463.

NIU Sujian , , XIE Mengyu , , ZHOU Zhiyuan , SHI Baosen , . Progress on ellipsometry utilizing quantum entangled light sources[J]. Chinese Journal of Quantum Electronics, 2025, 42(4): 450-463.

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基于量子纠缠光源的椭圆偏振测量技术研究进展 (特邀)

Progress on ellipsometry utilizing quantum entangled light sources

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