J4 ›› 2013, Vol. 30 ›› Issue (3): 348-353.

• Laser Applications • Previous Articles     Next Articles

SERS detection sensitivity of fiber Raman probe limited by nanostructure damage threshold

Liao Yanlin, ZHANG La-mei, Liu Ye, Cao Jie, Mao Qinghe   

  1. 1 Anhui Provincial Key Laboratory of Photonics Devices and Materials, Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Hefei, Anhui 230031, China; 2 School of physics and materials, Anhui University, Hefei 230039, China; 3 University of Science and Technology of China, Hefei 230022,China
  • Received:2012-05-07 Revised:2012-08-14 Published:2013-05-28 Online:2013-05-06

Abstract: The relationship between Surface-Enhanced Raman Scattering (SERS) power collected by the fiber Raman probe and sample position is investigated theoretically under the sample damage threshold limit by using ray tracing method. The results show that, in a given damage excitation power density threshold, the SERS power collected by the probe with different focal-length lens increases when the sample deviates from the focal plane. Furthermore, compared with the situation that the sample is away from the probe and deviates from the focal plane, SERS power collected by the probe is higher at the situation that the sample is close to the probe and deviates from the focal plane. In addition, the lager the collection fiber core diameter is, the greater the power collected by the probe is.

Key words: spectroscopy, surface-enhanced Raman scattering, fiber Raman probe, damage, localized surface plasmon resonance

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